ICS:71.040.40
Showing 10–18 of 126 results
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ISO 13083:2015 Surface chemical analysis – Scanning probe microscopy – Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
CDN $173.00 Add to cart -
ISO 6144:2003 Gas analysis – Preparation of calibration gas mixtures – Static volumetric method
CDN $273.00 Add to cart -
ISO 24417:2022 Surface chemical analysis – Analysis of metallic nanolayers on iron based substrates by glow-discharge optical-emission spectrometry
CDN $273.00 Add to cart -
ISO 15969:2021 Surface chemical analysis – Depth profiling – Measurement of sputtered depth
CDN $173.00 Add to cart -
ISO 18114:2021 Surface chemical analysis – Secondary-ion mass spectrometry – Determination of relative sensitivity factors from ion-implanted reference materials
CDN $76.00 Add to cart -
ISO 14606:2022 Surface chemical analysis – Sputter depth profiling – Optimization using layered systems as reference materials
CDN $173.00 Add to cart -
ISO 25138:2025 Surface chemical analysis – Analysis of metal oxide films by glow discharge optical emission spectrometry
CDN $312.00 Add to cart -
ISO 20341:2003 Surface chemical analysis – Secondary-ion mass spectrometry – Method for estimating depth resolution parameters with multiple delta-layer reference materials
CDN $76.00 Add to cart -
ISO 19668:2017 Surface chemical analysis – X-ray photoelectron spectroscopy – Estimating and reporting detection limits for elements in homogeneous materials
CDN $233.00 Add to cart
