ICS:71.040.40

Showing 10–18 of 126 results

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  ISO 13083:2015 Surface chemical analysis – Scanning probe microscopy – Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes

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  CDN $173.00 Add to cart
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  ISO 19668:2017 Surface chemical analysis – X-ray photoelectron spectroscopy – Estimating and reporting detection limits for elements in homogeneous materials

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  CDN $233.00 Add to cart
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  ISO 16962:2017 Surface chemical analysis – Analysis of zinc- and/or aluminium-based metallic coatings by glow-discharge optical-emission spectrometry

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  CDN $312.00 Add to cart
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  ISO 19830:2015 Surface chemical analysis – Electron spectroscopies – Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy

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  CDN $233.00 Add to cart
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  ISO 20411:2018 Surface chemical analysis – Secondary ion mass spectrometry – Correction method for saturated intensity in single ion counting dynamic secondary ion mass spectrometry

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  CDN $173.00 Add to cart
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  ISO 20579:2021 Surface chemical analysis – Sample handling, preparation and mounting – Part 3: Biomaterials

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  CDN $115.00 Add to cart
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  ISO 6145:2018 Gas analysis – Preparation of calibration gas mixtures using dynamic methods – Part 7: Thermal mass-flow controllers

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  CDN $173.00 Add to cart
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  ISO 10810:2019 Surface chemical analysis – X-ray photoelectron spectroscopy – Guidelines for analysis

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  CDN $273.00 Add to cart
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  ISO 23170:2022 Surface chemical analysis – Depth profiling – Non-destructive depth profiling of nanoscale heavy metal oxide thin films on Si substrates with medium energy ion scattering

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  CDN $273.00 Add to cart