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ICS:71.040.40
Showing 19–27 of 126 results
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ISO 24417:2022 Surface chemical analysis – Analysis of metallic nanolayers on iron based substrates by glow-discharge optical-emission spectrometry
CDN $273.00 Add to cart -
ISO 15969:2021 Surface chemical analysis – Depth profiling – Measurement of sputtered depth
CDN $173.00 Add to cart -
ISO 18114:2021 Surface chemical analysis – Secondary-ion mass spectrometry – Determination of relative sensitivity factors from ion-implanted reference materials
CDN $76.00 Add to cart -
ISO 14606:2022 Surface chemical analysis – Sputter depth profiling – Optimization using layered systems as reference materials
CDN $173.00 Add to cart -
ISO 25138:2025 Surface chemical analysis – Analysis of metal oxide films by glow discharge optical emission spectrometry
CDN $312.00 Add to cart -
ISO 20341:2003 Surface chemical analysis – Secondary-ion mass spectrometry – Method for estimating depth resolution parameters with multiple delta-layer reference materials
CDN $76.00 Add to cart -
ISO 6144:2003 Gas analysis – Preparation of calibration gas mixtures – Static volumetric method
CDN $273.00 Add to cart -
ISO 16242:2011 Surface chemical analysis – Recording and reporting data in Auger electron spectroscopy (AES)
CDN $115.00 Add to cart -
ISO 22335:2007 Surface chemical analysis – Depth profiling – Measurement of sputtering rate: mesh-replica method using a mechanical stylus profilometer
CDN $173.00 Add to cart
