ICS:71.040.40
Showing 55–63 of 134 results
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ISO 11505:2012 Surface chemical analysis – General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
CDN $295.00 Add to cart -
ISO 20289:2018 Surface chemical analysis – Total reflection X-ray fluorescence analysis of water
CDN $251.00 Add to cart -
ISO 13084:2018 Surface chemical analysis – Secondary ion mass spectrometry – Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
CDN $186.00 Add to cart -
ISO 13084:2025 Surface chemical analysis — Mass spectrometries — Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
CDN $186.00 Add to cart -
ISO 16666:2025 Surface chemical analysis — Total reflection X-ray fluorescence — Principles and general requirements
CDN $251.00 Add to cart -
ISO 78:1999 Chemistry – Layouts for standards – Part 2: Methods of chemical analysis
CDN $263.00 Add to cart -
ISO 15338:2025 Surface chemical analysis – Glow discharge mass spectrometry – Operating procedures
CDN $195.00 Add to cart -
ISO 6142:2015 Gas analysis – Preparation of calibration gas mixtures – Part 1: Gravimetric method for Class I mixtures
CDN $352.00 Add to cart -
ISO 22415:2019 Surface chemical analysis – Secondary ion mass spectrometry – Method for determining yield volume in argon cluster sputter depth profiling of organic materials
CDN $310.00 Add to cart
