ICS:71.040.40
Showing 91–99 of 126 results
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ISO 12963:2017 Gas analysis – Comparison methods for the determination of the composition of gas mixtures based on one- and two-point calibration
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ISO 17331:2010 Surface chemical analysis – Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence (TXRF) spectroscopy – Amendment 1
CDN $32.00 Add to cart -
ISO 15796:2005 Gas analysis – Investigation and treatment of analytical bias
CDN $273.00 Add to cart -
ISO 21079:2008 Chemical analysis of refractories containing alumina, zirconia, and silica – Refractories containing 5 percent to 45 percent of ZrO2 (alternative to the X-ray fluorescence method) – Part 3: Flame atomic absorption spectrophotometry (FAAS) and inductively coupled plasma emission spectrometry (ICP -AES)
CDN $173.00 Add to cart -
ISO 11039:2012 Surface chemical analysis – Scanning-probe microscopy – Measurement of drift rate
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ISO 760:1978 Determination of water – Karl Fischer method (General method)
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ISO 13424:2013 Surface chemical analysis – X-ray photoelectron spectroscopy – Reporting of results of thin-film analysis
CDN $312.00 Add to cart -
ISO 15472:2010 Surface chemical analysis – X-ray photoelectron spectrometers – Calibration of energy scales
CDN $273.00 Add to cart -
ISO 6143:2001 Gas analysis – Comparison methods for determining and checking the composition of calibration gas mixtures
CDN $273.00 Add to cart
