ICS:71.040.40

Showing 28–36 of 126 results

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  ISO 16268:2009 Surface chemical analysis – Proposed procedure for certifying the retained areic dose in a working reference material produced by ion implantation

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  ISO 28600:2011 Surface chemical analysis – Data transfer format for scanning-probe microscopy

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  ISO 14237:2010 Surface chemical analysis – Secondary-ion mass spectrometry – Determination of boron atomic concentration in silicon using uniformly doped materials

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  ISO 13095:2014 Surface Chemical Analysis – Atomic force microscopy – Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement

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  ISO 6145:2019 Gas analysis – Preparation of calibration gas mixtures using dynamic methods – Part 1: General aspects

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  ISO 19693:2018 Surface chemical analysis – Characterization of functional glass substrates for biosensing applications

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  ISO 20579:2018 Surface chemical analysis – Guidelines to sample handling, preparation and mounting – Part 4: Reporting information related to the history, preparation, handling and mounting of nano-objects prior to surface analysis

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  ISO 14167:2018 Gas analysis – General quality aspects and metrological traceability of calibration gas mixtures

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  ISO 15470:2017 Surface chemical analysis – X-ray photoelectron spectroscopy – Description of selected instrumental performance parameters

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  CDN $76.00 Add to cart