ICS:71.040.40
Showing 28–36 of 126 results
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ISO 16243:2011 Surface chemical analysis – Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
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ISO 22335:2007 Surface chemical analysis – Depth profiling – Measurement of sputtering rate: mesh-replica method using a mechanical stylus profilometer
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ISO 16268:2009 Surface chemical analysis – Proposed procedure for certifying the retained areic dose in a working reference material produced by ion implantation
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ISO 28600:2011 Surface chemical analysis – Data transfer format for scanning-probe microscopy
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ISO 14237:2010 Surface chemical analysis – Secondary-ion mass spectrometry – Determination of boron atomic concentration in silicon using uniformly doped materials
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ISO 13095:2014 Surface Chemical Analysis – Atomic force microscopy – Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement
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ISO 6145:2019 Gas analysis – Preparation of calibration gas mixtures using dynamic methods – Part 1: General aspects
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ISO 6227:1982 Chemical products for industrial use – General method for determination of chloride ions – Potentiometric method
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ISO 8213:1986 Chemical products for industrial use – Sampling techniques – Solid chemical products in the form of particles varying from powders to coarse lumps
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