ICS:71.040.40
Showing 73–81 of 126 results
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ISO 15471:2016 Surface chemical analysis – Auger electron spectroscopy – Description of selected instrumental performance parameters
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ISO 22415:2019 Surface chemical analysis – Secondary ion mass spectrometry – Method for determining yield volume in argon cluster sputter depth profiling of organic materials
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ISO 13084:2018 Surface chemical analysis – Secondary ion mass spectrometry – Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer
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ISO 22581:2021 Surface chemical analysis – Near real-time information from the X-ray photoelectron spectroscopy survey scan – Rules for identification of, and correction for, surface contamination by carbon-containing compounds
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ISO 22933:2022 Surface chemical analysis – Secondary ion mass spectrometry – Method for the measurement of mass resolution in SIMS
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ISO 14975:2000 Surface chemical analysis – Information formats
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ISO 6206:1979 Chemical products for industrial use – Sampling – Vocabulary
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ISO 7504:2015 Gas analysis – Vocabulary
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ISO 18115:2022 Surface chemical analysis – Vocabulary – Part 3: Terms used in optical interface analysis
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