ICS:71.040.40
Showing 55–63 of 126 results
-

ISO 78:1999 Chemistry – Layouts for standards – Part 2: Methods of chemical analysis
CDN $233.00 Add to cart -

ISO 23830:2008 Surface chemical analysis – Secondary-ion mass spectrometry – Repeatability and constancy of the relative-intensity scale in static secondary-ion mass spectrometry
CDN $115.00 Add to cart -

ISO 27911:2011 Surface chemical analysis – Scanning-probe microscopy – Definition and calibration of the lateral resolution of a near-field optical microscope
CDN $173.00 Add to cart -

ISO 29081:2010 Surface chemical analysis – Auger electron spectroscopy – Reporting of methods used for charge control and charge correction
CDN $233.00 Add to cart -

ISO 11505:2012 Surface chemical analysis – General procedures for quantitative compositional depth profiling by glow discharge optical emission spectrometry
CDN $273.00 Add to cart -

ISO 6141:2015 Gas analysis – Contents of certificates for calibration gas mixtures
CDN $115.00 Add to cart -

ISO 19319:2013 Surface chemical analysis – Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods
CDN $390.00 Add to cart -

ISO 6142:2020 Gas analysis – Preparation of calibration gas mixtures – Part 1: Gravimetric method for Class I mixtures – Amendment 1: Corrections to formulae in Annex E and Annex G
CDN $32.00 Add to cart -

ISO 6228:1980 Chemical products for industrial use – General method for determination of traces of sulphur compounds, as sulphate, by reduction and titrimetry
CDN $115.00 Add to cart





